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Liao, Mou-Yuan*; Wu, Chien-Wei (Accepted). Supplier selection based on normal process yield: the Bayesian inference. Neural Computing and Applications.[SCI]
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Liao, Mou-Yuan*; Pearn, W.L. (2019/1). Modified Weighted Standard Deviation Index for Adequately Interpreting a Supplier’s Lognormal Process Capability. Journal of Engineering Manufacture, Vol. 223, No. 3, p.p.999-1008.[SCI]
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Liao, Mou-Yuan; Ling, Hsiao-Chi (2018/5/1). Effective Control Chart for Monitoring the Capability Stability of Non-Normal Processes Having S-Type Quality. Journal of Testing and Evaluation, Vol. 46, No. 3, p.p.1196-1208.[SCI]
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Liao, Mou-Yuan* (2017/8). Efficient Technique for Assessing Actual Non-normal Quality Loss: Markov Chain Monte Carlo. Quality and Reliability Engineering International, Vol. 33 , No. 5 , p.p.945 -957 .[SCI]
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Liao, Mou-Yuan*; Wu, Chien-Wei; Wen, Shu-Hai (2017/2). Assessing S-type Process Quality of Data Involving Batch-to-Batch Variation. Journal of Testing and Evaluation, Vol. 45 , No. 4 , p.p.1425 -1435 .[SCI]
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Liao, M.Y.*, Lin, C.-H., Wu, C.W., Yang, C.H. (2017/1). Reliable confidence intervals for assessing normal process incapability. Communications in Statistics: Simulation and Computation, Vol. 46 , No. 1 , Col. 2 , p.p.446 -457 .[SCI]
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Liao, Mou-Yuan* (2016/11). Markov chain Monte Carlo in Bayesian models for testing gamma and lognormal S-type process qualities. International Journal of Production Research, Vol. 54 , No. 24 , p.p.7491 -7503 .[SCI]
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Liao, Mou-Yuan* (2016/5). Process Capability Control Chart for Non-Normal Data – Evidence of On-Going Capability Assessment. Quality Technology and Quantitative Management, Vol. 13 , No. 2 , p.p.165 -181 .[SCI]
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Wu, Chien-Wei; Liao, Mou-Yuan*; Lin, Chi-Wei; Lin, Tzu-Ling (2016/4). Testing and Ranking Multiple Wafer Manufacturing Processes with Fuzzy Quality Data. Journal of Testing and Evaluation, Vol. 44 , No. 5 , p.p.1970 -1977 .[SCI]
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Liao, Mou-Yuan*; Wu, Chien-Wei (2016/3/1). Efficient Method for Testing the Batch-Processing Process Yield. International Journal of Information and Management Science, Vol. 27 , No. 1 , p.p.1 -16 .[TSSCI]
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Liao, Mou-Yuan*; Wu, Chien-Wei; Lin, Chien-Hua (2015/11/1). Assessing True TFT-LCD Process Quality in the Presence of Unavoidable Measurement Errors. Journal of Testing and Evaluation, Vol. 43 , No. 6 , p.p.1479 -1486 .[SCI]
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Liao, Mou-Yuan* (2015/9). Effective Control Chart for Monitoring the Stability of Non-normal Process Capability. International Journal of Information and Management Sciences, Vol. 25 , No. 3 , p.p.239 -251 .[TSSCI]
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Liao, Mou-Yuan*; Pearn, W L; Liu, Yen-Lun (2015/4). Assessing the Actual Gamma Process Quality – A Curve-Fitting Approach for Modifying the Non-Normal Flexible Index. International Journal of Production Research, Vol. 53 , No. 15 , p.p.4720 -4734 .[SCI]
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Liao, Mou-Yuan* (2015/2). Assessing Process Incapability when Collecting Data from Multiple Batches. International Journal of Production Research, Vol. 53 , No. 7 , p.p.2041 -2054 .[SCI]
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Wu, Chien-Wei; Liao, Mou-Yuan*; Lin, Chung-Yang (2014/8). On Ranking Multiple Touch-Screen Panel Suppliers through the CTQ – Applied Fuzzy Techniques for Inspection with Unavoidable Measurement Errors. Neural Computing and Applications, Vol. 25 , No. 2 , p.p.481 -490 .[SCI]
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Liao, Mou-Yuan*; Wu, C.W.; Zhang, F.Y. (2014/7). Fuzzy yield index for optimal tool replacement policy. Advanced Materials Research, Vol. 1028 , p.p.139 -144 .[EI]
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Wu, Chien-Wei; Liao, Mou-Yuan (2014/7/1). Fuzzy Nonlinear Programming Approach for Evaluating and Ranking Process Yields with Imprecise Data. Fuzzy Sets and Systems, Vol. 246 , p.p.146 -155 .[SCI]
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Yang, Chien-Hsin; Liao, Mou-Yuan; Huang, Kuo-Liang (2014/4). A hybrid classification mehod: Using a support vector machine for rule extraction on diabetes diagnosis. International Review of Bussiness and Economics, No. 5 , p.p.75 -85 .
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Wu, Chien-Wei; Chang, Ying-Chung; Liao, Mou-Yuan* (2014/3/1). Fuzzy Estimation for Process Loss Assessment. Journal of the Chinese Institute of Engineers, Vol. 37 , No. 1 , p.p.1 -6 .[SCI]
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Liao, Mou-Yuan*; Wu, Chien-Wei; Wu, Jia-Wei (2013/10). Fuzzy Inference to Supplier Evaluation and Selection Based on Quality Index: A Flexible Approach. Neural Computing and Applications, Vol. 23 , No. 1 , p.p.117 -127 .[SCI]
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Wu, Horng-Huei; Liao, Mou-Yuan; Tsai, Chih-Hung; Tsai, Shih-Chieh; Lu, Min-Jer; Tsai, Tai-Ping (2013/7). A Study of Theory of Constraints Supply Chain Replenishment System. International Journal of Academic Research in Accounting, Finance and Management Sciences, Vol. 3 , No. 3 , p.p.82 -98 .
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Wu, Chien-Wei; Liao, Mou-Yuan*; Yang, Tsung-Tse (2013/3). Efficient methods for comparing two process yields – strategies on supplier selection. International Journal of Production Research, p.p.1587 -1602 .[SCI]
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Wu, C.W.; Liao, M.Y.*; Chen, J.C. (2012/6/16). An Improved Approach for Constructing Lower Confidence Bound on Process Yield. European Journal of Industrial Engineering., Vol. 6 , No. 3 , p.p.369 -390 .[SCI]
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Wu, C.W.; Liao, M.Y.* (2012/4/25). Generalized Inference for Measuring Process Yield with the Contamination of Measurement Errors - Quality Control for Silicon Wafer Manufacturing Processes in Semiconductor Industry. IEEE Transactions on Semiconductor Manufacturing, Vol. 25 , No. 2 , p.p.272 -283 .[SCI]
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Ling, H.C.; Hsieh, S.Y.*; Chang, J.C.; Liao, M.Y.; Lee, C.S. (2011/12/24). Value of Supply Chain Management of Taiwan's Hospitality Industry. Journal of Statistics and Management Systems, Vol. 14 , No. 5 , p.p.995 -1006 .[EI]
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楊健炘*; 葉子明; 廖茂原 (2011/6/23)。穿著高跟鞋對於長期站立服務業者腿部不適影響之研究。 工作與休閒學刊,第2 卷,第2 期,頁155 -163 。
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Pearn, W.L.; Liao, M.Y.*; Wu, C.W.; Chu, Y.T. (2011/3/22). Two Tests for Supplier Selection Based on Process Yield. Journal of Testing and Evaluation, Vol. 39 , No. 2 , p.p.126 -133 .[SCI]
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Liao, M.Y. and Wu, C.W.* (2010/8/24). Evaluating Process Performance Based on the Incapability Index for Measurements with Uncertainty. Expert Systems with Applications, Vol. 37 , No. 8 , p.p.5999 -6006 .[SCI]
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Liao, Mou-Yuan* (2010/8/22). Economic Tolerance Design for Folded Normal Data. International Journal of Production Research, Vol. 48 , No. 14 , p.p.4123 -4137 .[SCI]
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Liao, M.Y.*; Wu, C.W. (2010/6/25). An Alternative Approach to Controlling Tool Wear Problem with an Application to Grinding Wheels Management in Manufacturing Silicon Wafers. Journal of Information and Optimization Sciences, Vol. 31 , No. 1 , p.p.231 -244 .[EI]
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Liao, M.Y.*; Kang, H.Y.; Lee, A.H.I.; Wu, C.W. (2010/3/24). Capability Testing Based on Subsamples: A Case on Photolithography Process Control in Wafer Fabrication. Journal of Testing and Evaluation, Vol. 38 , No. 2 , p.p.222 -231 .[SCI]
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Wu, C.W.; Liao, M.Y.*; Shu, M.H. (2010/3/24). Process Performance Evaluation with Imprecise Information. Journal of Testing and Evaluation, Vol. 38 , No. 2 , p.p.137 -142 .[SCI]
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Liao, M.Y.* (2009/12/25). Gage Capability Control for Electronic Measurement Instruments with Time-Dependent Degeneration. Journal of Statistics and Management Systems, Vol. 12 , No. 6 , p.p.1195 -1206 .[EI]
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Wu, C.W.*; Liao, M.Y. (2009/11/26). Estimating and Testing Process Yield with Imprecise Data. Expert Systems with Applications, Vol. 36 , No. 8 , p.p.11006 -11012 .[SCI]
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Pearn, W.L.; Kang, H.Y.; Lee, A.H.I.; Liao, M.Y. (2009/8/26). Photolithography Control in Wafer Fabrication Based on Process Capability Indices with Multiple Characteristics. IEEE Transactions on Semiconductor Manufacturing, Vol. 22 , No. 3 , p.p.351 -356 .[SCI]
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Liao, M.Y.* (2009/4/24). Measurement Instruments Control with Both Accuracy and Precision Considerations. Journal of Statistics and Management Systems, Vol. 12 , No. 2 , p.p.273 -285 .[EI]
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Pearn, W.L.*; Liao, M.Y. (2007/12/25). Estimating and Testing Process Precision with Presence of Gauge Measurement Errors. Quality and Quantity, Vol. 41 , No. 5 , p.p.757 -777 .[SSCI]
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Leu, C.H.; Liao, M.Y.; Chen, K.S. (2006/8/26). Selecting a Better Supplier by Testing Unilateral Specification Process Capability Indices Cpu and Cpl. American Journal of Mathematical and Management Sciences, Vol. 26 , No. 3-4 , p.p.329 -354 .[EI]
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Pearn, W.L.; Liao, M.Y. (2006/7/25). One-sided Process Capability Assessment in the Presence of Measurement Errors. Quality and Reliability Engineering International, Vol. 22 , No. 7 , p.p.771 -785 .[SCI]
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Pearn, W.L.; Liao, M.Y. (2005/5/26). Measuring Process Capability Based on Cpk with Gauge Measurement Errors. Microelectronics Reliability, Vol. 45 , p.p.739 -751 .[SCI]
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溫敏杰*; 廖茂原; 許士振; 連志偉 (2000/6/23)。傳統民意調查方法與新興網路民意調查之比較 - 以總統大選為例。 民意研究季刊,第214 卷,頁88 -101 。
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